Mariano, R. G., Yau, A., McKeown, J. T., Kumar, M., & Kanan, M. W. (2020). Comparing Scanning Electron Microscope and Transmission Electron Microscope Grain Mapping Techniques Applied to Well-Defined and Highly Irregular Nanoparticles. ACS Omega.

Mariano, Ruperto G., Allison Yau, Joseph T. McKeown, Mukul Kumar, and Matthew W. Kanan. "Comparing Scanning Electron Microscope and Transmission Electron Microscope Grain Mapping Techniques Applied to Well-Defined and Highly Irregular Nanoparticles." ACS Omega 2020.

Mariano, Ruperto G., et al. "Comparing Scanning Electron Microscope and Transmission Electron Microscope Grain Mapping Techniques Applied to Well-Defined and Highly Irregular Nanoparticles." ACS Omega 2020.