Schwartz, J. J., Chuang, H., Rosenberger, M. R., Sivaram, S. V., McCreary, K. M., Jonker, B. T., & Centrone, A. (2019). Chemical Identification of Interlayer Contaminants within van der Waals Heterostructures. ACS Appl Mater Interfaces.
Čikaški stil citiranjaSchwartz, Jeffrey J., Hsun-Jen Chuang, Matthew R. Rosenberger, Saujan V. Sivaram, Kathleen M. McCreary, Berend T. Jonker, i Andrea Centrone. "Chemical Identification of Interlayer Contaminants Within Van Der Waals Heterostructures." ACS Appl Mater Interfaces 2019.
MLA način citiranjaSchwartz, Jeffrey J., et al. "Chemical Identification of Interlayer Contaminants Within Van Der Waals Heterostructures." ACS Appl Mater Interfaces 2019.
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