एपीए उद्धरण

Illés, B., Hurtony, T., Krammer, O., Medgyes, B., Dušek, K., & Bušek, D. (2019). Effect of Cu Substrate Roughness and Sn Layer Thickness on Whisker Development from Sn Thin-Films. Materials (Basel).

शिकागो स्टाइल उद्धरण

Illés, Balázs, Tamás Hurtony, Olivér Krammer, Bálint Medgyes, Karel Dušek, और David Bušek. "Effect of Cu Substrate Roughness and Sn Layer Thickness On Whisker Development From Sn Thin-Films." Materials (Basel) 2019.

एमएलए उद्धरण

Illés, Balázs, et al. "Effect of Cu Substrate Roughness and Sn Layer Thickness On Whisker Development From Sn Thin-Films." Materials (Basel) 2019.

चेतावनी: ये उद्धरण हमेशा 100% सटीक नहीं हो सकते हैं.