Ye, X., Li, J., Cheng, Y., Yao, F., Long, L., Wang, Y., . . . Chen, G. (2019). Genome-wide association study reveals new loci for yield-related traits in Sichuan wheat germplasm under stripe rust stress. BMC Genomics.
Stile di citazione ChicagoYe, Xueling, et al. "Genome-wide Association Study Reveals New Loci for Yield-related Traits in Sichuan Wheat Germplasm Under Stripe Rust Stress." BMC Genomics 2019.
Citazione MLAYe, Xueling, et al. "Genome-wide Association Study Reveals New Loci for Yield-related Traits in Sichuan Wheat Germplasm Under Stripe Rust Stress." BMC Genomics 2019.
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