Jang, K., Kim, Y., Park, J., & Yi, J. (2019). Electrical and Structural Characteristics of Excimer Laser-Crystallized Polycrystalline Si(1−x)Ge(x) Thin-Film Transistors. Materials (Basel).
Citação norma ChicagoJang, Kyungsoo, Youngkuk Kim, Joonghyun Park, and Junsin Yi. "Electrical and Structural Characteristics of Excimer Laser-Crystallized Polycrystalline Si(1−x)Ge(x) Thin-Film Transistors." Materials (Basel) 2019.
Citação norma MLAJang, Kyungsoo, Youngkuk Kim, Joonghyun Park, and Junsin Yi. "Electrical and Structural Characteristics of Excimer Laser-Crystallized Polycrystalline Si(1−x)Ge(x) Thin-Film Transistors." Materials (Basel) 2019.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.