Liu, H., Han, G., Liu, Y., & Hao, Y. (2019). High Mobility Ge pMOSFETs with ZrO(2) Dielectric: Impacts of Post Annealing. Nanoscale Res Lett.
Citação norma ChicagoLiu, Huan, Genquan Han, Yan Liu, and Yue Hao. "High Mobility Ge PMOSFETs With ZrO(2) Dielectric: Impacts of Post Annealing." Nanoscale Res Lett 2019.
MLA CitationLiu, Huan, Genquan Han, Yan Liu, and Yue Hao. "High Mobility Ge PMOSFETs With ZrO(2) Dielectric: Impacts of Post Annealing." Nanoscale Res Lett 2019.
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