Zhou, Y., Ambarish, C. V., Gruenke, R., Jaeckel, F. T., Kripps, K. L., McCammon, D., . . . Yoon, W. (2018). Mapping TES Temperature Sensitivity and Current Sensitivity as a Function of Temperature, Current, and Magnetic Field with IV curve and Complex Admittance Measurements. J Low Temp Phys.
Style de citation ChicagoZhou, Y., et al. "Mapping TES Temperature Sensitivity and Current Sensitivity As a Function of Temperature, Current, and Magnetic Field With IV Curve and Complex Admittance Measurements." J Low Temp Phys 2018.
Style de citation MLAZhou, Y., et al. "Mapping TES Temperature Sensitivity and Current Sensitivity As a Function of Temperature, Current, and Magnetic Field With IV Curve and Complex Admittance Measurements." J Low Temp Phys 2018.