Krivcov, A., Ehrler, J., Fuhrmann, M., Junkers, T., & Möbius, H. (2019). Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy. Beilstein J Nanotechnol.
Citación estilo ChicagoKrivcov, Alexander, Jasmin Ehrler, Marc Fuhrmann, Tanja Junkers, and Hildegard Möbius. "Influence of Dielectric Layer Thickness and Roughness On Topographic Effects in Magnetic Force Microscopy." Beilstein J Nanotechnol 2019.
Cita MLAKrivcov, Alexander, et al. "Influence of Dielectric Layer Thickness and Roughness On Topographic Effects in Magnetic Force Microscopy." Beilstein J Nanotechnol 2019.
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