Cita APA

McCrory, D. J., Anders, M. A., Ryan, J. T., Shrestha, P. R., Cheung, K. P., Lenahan, P. M., & Campbell, J. P. (2019). Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing station. Rev Sci Instrum.

Chicago Style Citation

McCrory, Duane J., Mark A. Anders, Jason T. Ryan, Pragya R. Shrestha, Kin P. Cheung, Patrick M. Lenahan, i Jason P. Campbell. "Slow- and Rapid-scan Frequency-swept Electrically Detected Magnetic Resonance of MOSFETs With a Non-resonant Microwave Probe Within a Semiconductor Wafer-probing Station." Rev Sci Instrum 2019.

Cita MLA

McCrory, Duane J., et al. "Slow- and Rapid-scan Frequency-swept Electrically Detected Magnetic Resonance of MOSFETs With a Non-resonant Microwave Probe Within a Semiconductor Wafer-probing Station." Rev Sci Instrum 2019.