Sun, Y., Wu, D., Liu, K., & Zheng, F. (2019). Colossal Permittivity and Low Dielectric Loss of Thermal Oxidation Single-Crystalline Si Wafers. Materials (Basel).
Style de citation ChicagoSun, Yalong, Di Wu, Kai Liu, et Fengang Zheng. "Colossal Permittivity and Low Dielectric Loss of Thermal Oxidation Single-Crystalline Si Wafers." Materials (Basel) 2019.
Style de citation MLASun, Yalong, Di Wu, Kai Liu, et Fengang Zheng. "Colossal Permittivity and Low Dielectric Loss of Thermal Oxidation Single-Crystalline Si Wafers." Materials (Basel) 2019.
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