APA Alıntı

Yu, J., Xu, X., Gong, T., Luo, Q., Dong, D., Yuan, P., . . . Liu, M. (2019). Suppression of Filament Overgrowth in Conductive Bridge Random Access Memory by Ta(2)O(5)/TaO(x) Bi-Layer Structure. Nanoscale Res Lett.

Chicago Stili Alıntı

Yu, Jie, et al. "Suppression of Filament Overgrowth in Conductive Bridge Random Access Memory By Ta(2)O(5)/TaO(x) Bi-Layer Structure." Nanoscale Res Lett 2019.

MLA Alıntı

Yu, Jie, et al. "Suppression of Filament Overgrowth in Conductive Bridge Random Access Memory By Ta(2)O(5)/TaO(x) Bi-Layer Structure." Nanoscale Res Lett 2019.