APA Alıntı

Wei, L., Yin, C., & Liu, J. T. (2018). Dual-axis confocal microscopy for point-of-care pathology. IEEE J Sel Top Quantum Electron.

Chicago Stili Alıntı

Wei, Linpeng, Chengbo Yin, ve Jonathan T.C Liu. "Dual-axis Confocal Microscopy for Point-of-care Pathology." IEEE J Sel Top Quantum Electron 2018.

MLA Alıntı

Wei, Linpeng, Chengbo Yin, ve Jonathan T.C Liu. "Dual-axis Confocal Microscopy for Point-of-care Pathology." IEEE J Sel Top Quantum Electron 2018.