Bajda, S., Riga, M., Wybouw, N., Papadaki, S., Ouranou, E., Fotoukkiaii, S. M., . . . Van Leeuwen, T. (2018). Fitness costs of key point mutations that underlie acaricide target‐site resistance in the two‐spotted spider mite Tetranychus urticae. Evol Appl.
Stile di citazione ChicagoBajda, Sabina, Maria Riga, Nicky Wybouw, Stavrini Papadaki, Eleni Ouranou, Seyedeh Masoumeh Fotoukkiaii, John Vontas, e Thomas Van Leeuwen. "Fitness Costs of Key Point Mutations That Underlie Acaricide Target‐site Resistance in the Two‐spotted Spider Mite Tetranychus Urticae." Evol Appl 2018.
Citazione MLABajda, Sabina, et al. "Fitness Costs of Key Point Mutations That Underlie Acaricide Target‐site Resistance in the Two‐spotted Spider Mite Tetranychus Urticae." Evol Appl 2018.