APA Цитирование

Wan, L., He, F., Qin, Y., Lin, Z., Su, J., Chang, J., & Hao, Y. (2018). Effects of Interfacial Passivation on the Electrical Performance, Stability, and Contact Properties of Solution Process Based ZnO Thin Film Transistors. Materials (Basel).

Chicago-стиль цитирования

Wan, Liaojun, Fuchao He, Yu Qin, Zhenhua Lin, Jie Su, Jingjing Chang, and Yue Hao. "Effects of Interfacial Passivation On the Electrical Performance, Stability, and Contact Properties of Solution Process Based ZnO Thin Film Transistors." Materials (Basel) 2018.

MLA-цитирование

Wan, Liaojun, et al. "Effects of Interfacial Passivation On the Electrical Performance, Stability, and Contact Properties of Solution Process Based ZnO Thin Film Transistors." Materials (Basel) 2018.

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