Wan, L., He, F., Qin, Y., Lin, Z., Su, J., Chang, J., & Hao, Y. (2018). Effects of Interfacial Passivation on the Electrical Performance, Stability, and Contact Properties of Solution Process Based ZnO Thin Film Transistors. Materials (Basel).
Chicago-стиль цитированияWan, Liaojun, Fuchao He, Yu Qin, Zhenhua Lin, Jie Su, Jingjing Chang, and Yue Hao. "Effects of Interfacial Passivation On the Electrical Performance, Stability, and Contact Properties of Solution Process Based ZnO Thin Film Transistors." Materials (Basel) 2018.
MLA-цитированиеWan, Liaojun, et al. "Effects of Interfacial Passivation On the Electrical Performance, Stability, and Contact Properties of Solution Process Based ZnO Thin Film Transistors." Materials (Basel) 2018.
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