APA-viite

Miyauchi, Y., Konabe, S., Wang, F., Zhang, W., Hwang, A., Hasegawa, Y., . . . Matsuda, K. (2018). Evidence for line width and carrier screening effects on excitonic valley relaxation in 2D semiconductors. Nat Commun.

Chicago-tyylinen lähdeviittaus

Miyauchi, Yuhei, et al. "Evidence for Line Width and Carrier Screening Effects On Excitonic Valley Relaxation in 2D Semiconductors." Nat Commun 2018.

MLA-viite

Miyauchi, Yuhei, et al. "Evidence for Line Width and Carrier Screening Effects On Excitonic Valley Relaxation in 2D Semiconductors." Nat Commun 2018.

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