Choi, S., Cha, W., Park, J., Kim, S., Kim, W., Yoon, C., . . . Park, D. (2018). Extremely Low Frequency-Magnetic Field (ELF-MF) Exposure Characteristics among Semiconductor Workers. Int J Environ Res Public Health.
Stile di citazione ChicagoChoi, Sangjun, Wonseok Cha, Jihoon Park, Seungwon Kim, Won Kim, Chungsik Yoon, Ju-Hyun Park, Kwonchul Ha, e Donguk Park. "Extremely Low Frequency-Magnetic Field (ELF-MF) Exposure Characteristics Among Semiconductor Workers." Int J Environ Res Public Health 2018.
Citazione MLAChoi, Sangjun, et al. "Extremely Low Frequency-Magnetic Field (ELF-MF) Exposure Characteristics Among Semiconductor Workers." Int J Environ Res Public Health 2018.
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