Yingling, V. R., Castro, D. A., Duong, J. T., Malpartida, F. J., Usher, J. R., & O, J. (2018). The reliability of vertical jump tests between the Vertec and My Jump phone application. PeerJ.
Citación estilo ChicagoYingling, Vanessa R., Dimitri A. Castro, Justin T. Duong, Fiorella J. Malpartida, Justin R. Usher, y Jenny O. "The Reliability of Vertical Jump Tests between the Vertec and My Jump Phone Application." PeerJ 2018.
Cita MLAYingling, Vanessa R., et al. "The Reliability of Vertical Jump Tests between the Vertec and My Jump Phone Application." PeerJ 2018.
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