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Wu, Chi-Chang, Hsin-Chiang You, Yu-Hsien Lin, Chia-Jung Yang, Yu-Ping Hsiao, Tun-Po Liao, and Wen-Luh Yang. "Impact of Electrode Surface Morphology in ZnO-Based Resistive Random Access Memory Fabricated Using the Cu Chemical Displacement Technique." Materials (Basel) 2018.

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