Son, K. J., Kim, T. K., Cha, Y., Oh, S. K., You, S., Ryou, J., & Kwak, J. S. (2017). Impact of Plasma Electron Flux on Plasma Damage‐Free Sputtering of Ultrathin Tin‐Doped Indium Oxide Contact Layer on p‐GaN for InGaN/GaN Light‐Emitting Diodes. Adv Sci (Weinh).
Chicago-stil citatSon, Kwang Jeong, Tae Kyoung Kim, Yu‐Jung Cha, Seung Kyu Oh, Shin‐Jae You, Jae‐Hyun Ryou, och Joon Seop Kwak. "Impact of Plasma Electron Flux On Plasma Damage‐Free Sputtering of Ultrathin Tin‐Doped Indium Oxide Contact Layer On P‐GaN for InGaN/GaN Light‐Emitting Diodes." Adv Sci (Weinh) 2017.
MLA-referensSon, Kwang Jeong, et al. "Impact of Plasma Electron Flux On Plasma Damage‐Free Sputtering of Ultrathin Tin‐Doped Indium Oxide Contact Layer On P‐GaN for InGaN/GaN Light‐Emitting Diodes." Adv Sci (Weinh) 2017.