APA-referens

Son, K. J., Kim, T. K., Cha, Y., Oh, S. K., You, S., Ryou, J., & Kwak, J. S. (2017). Impact of Plasma Electron Flux on Plasma Damage‐Free Sputtering of Ultrathin Tin‐Doped Indium Oxide Contact Layer on p‐GaN for InGaN/GaN Light‐Emitting Diodes. Adv Sci (Weinh).

Chicago-stil citat

Son, Kwang Jeong, Tae Kyoung Kim, Yu‐Jung Cha, Seung Kyu Oh, Shin‐Jae You, Jae‐Hyun Ryou, och Joon Seop Kwak. "Impact of Plasma Electron Flux On Plasma Damage‐Free Sputtering of Ultrathin Tin‐Doped Indium Oxide Contact Layer On P‐GaN for InGaN/GaN Light‐Emitting Diodes." Adv Sci (Weinh) 2017.

MLA-referens

Son, Kwang Jeong, et al. "Impact of Plasma Electron Flux On Plasma Damage‐Free Sputtering of Ultrathin Tin‐Doped Indium Oxide Contact Layer On P‐GaN for InGaN/GaN Light‐Emitting Diodes." Adv Sci (Weinh) 2017.

Varning: dessa hänvisningar är inte alltid fullständigt riktiga.