Velmurugan, R., Chao, J., Ram, S., Ward, E. S., & Ober, R. J. (2017). Intensity-based axial localization approaches for multifocal plane microscopy. Opt Express.
Citação norma ChicagoVelmurugan, Ramraj, Jerry Chao, Sripad Ram, E. Sally Ward, and Raimund J. Ober. "Intensity-based Axial Localization Approaches for Multifocal Plane Microscopy." Opt Express 2017.
Citação norma MLAVelmurugan, Ramraj, et al. "Intensity-based Axial Localization Approaches for Multifocal Plane Microscopy." Opt Express 2017.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.