APA ציטוט

DeWaele, M., Oh, Y., Park, C., Kang, Y. M., Shin, H., Blaha, C. D., . . . Jang, D. P. (2017). Baseline Drift Detrending Technique for Fast Scan Cyclic Voltammetry. Analyst.

Citação norma Chicago

DeWaele, Mark, et al. "Baseline Drift Detrending Technique for Fast Scan Cyclic Voltammetry." Analyst 2017.

ציטוט MLA

DeWaele, Mark, et al. "Baseline Drift Detrending Technique for Fast Scan Cyclic Voltammetry." Analyst 2017.

אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.