DeWaele, M., Oh, Y., Park, C., Kang, Y. M., Shin, H., Blaha, C. D., . . . Jang, D. P. (2017). Baseline Drift Detrending Technique for Fast Scan Cyclic Voltammetry. Analyst.
Citação norma ChicagoDeWaele, Mark, et al. "Baseline Drift Detrending Technique for Fast Scan Cyclic Voltammetry." Analyst 2017.
ציטוט MLADeWaele, Mark, et al. "Baseline Drift Detrending Technique for Fast Scan Cyclic Voltammetry." Analyst 2017.
אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.