Cita APA

Hughes, A., Askew, K., Scotson, C. P., Williams, K., Sauze, C., Corke, F., . . . Nibau, C. (2017). Non-destructive, high-content analysis of wheat grain traits using X-ray micro computed tomography. Plant Methods.

Citación estilo Chicago

Hughes, Aoife, Karen Askew, Callum P. Scotson, Kevin Williams, Colin Sauze, Fiona Corke, John H. Doonan, y Candida Nibau. "Non-destructive, High-content Analysis of Wheat Grain Traits Using X-ray Micro Computed Tomography." Plant Methods 2017.

Cita MLA

Hughes, Aoife, et al. "Non-destructive, High-content Analysis of Wheat Grain Traits Using X-ray Micro Computed Tomography." Plant Methods 2017.