Yuan, F., Deng, N., Shih, C., Tseng, Y., Chang, T., Chang, K., . . . Sze, S. M. (2017). Conduction Mechanism and Improved Endurance in HfO(2)-Based RRAM with Nitridation Treatment. Nanoscale Res Lett.
シカゴスタイル引用形Yuan, Fang-Yuan, et al. "Conduction Mechanism and Improved Endurance in HfO(2)-Based RRAM With Nitridation Treatment." Nanoscale Res Lett 2017.
MLA引用形式Yuan, Fang-Yuan, et al. "Conduction Mechanism and Improved Endurance in HfO(2)-Based RRAM With Nitridation Treatment." Nanoscale Res Lett 2017.
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