APA ציטוט

Hiller, D., López-Vidrier, J., Gutsch, S., Zacharias, M., Wahl, M., Bock, W., . . . König, D. (2017). Boron-Incorporating Silicon Nanocrystals Embedded in SiO(2): Absence of Free Carriers vs. B-Induced Defects. Sci Rep.

Citação norma Chicago

Hiller, Daniel, et al. "Boron-Incorporating Silicon Nanocrystals Embedded in SiO(2): Absence of Free Carriers Vs. B-Induced Defects." Sci Rep 2017.

ציטוט MLA

Hiller, Daniel, et al. "Boron-Incorporating Silicon Nanocrystals Embedded in SiO(2): Absence of Free Carriers Vs. B-Induced Defects." Sci Rep 2017.