Hiller, D., López-Vidrier, J., Gutsch, S., Zacharias, M., Wahl, M., Bock, W., . . . König, D. (2017). Boron-Incorporating Silicon Nanocrystals Embedded in SiO(2): Absence of Free Carriers vs. B-Induced Defects. Sci Rep.
Chicago Style citaatHiller, Daniel, et al. "Boron-Incorporating Silicon Nanocrystals Embedded in SiO(2): Absence of Free Carriers Vs. B-Induced Defects." Sci Rep 2017.
MLA citatieHiller, Daniel, et al. "Boron-Incorporating Silicon Nanocrystals Embedded in SiO(2): Absence of Free Carriers Vs. B-Induced Defects." Sci Rep 2017.
Let op: Deze citaties zijn niet altijd 100% accuraat.