Cita APA

Bachche, S., Nonoguchi, M., Kato, K., Kageyama, M., Koike, T., Kuribayashi, M., & Momose, A. (2017). Laboratory-based X-ray phase-imaging scanner using Talbot-Lau interferometer for non-destructive testing. Sci Rep.

Chicago Style Citation

Bachche, Shivaji, Masahiro Nonoguchi, Koichi Kato, Masashi Kageyama, Takafumi Koike, Masaru Kuribayashi, i Atsushi Momose. "Laboratory-based X-ray Phase-imaging Scanner Using Talbot-Lau Interferometer for Non-destructive Testing." Sci Rep 2017.

Cita MLA

Bachche, Shivaji, et al. "Laboratory-based X-ray Phase-imaging Scanner Using Talbot-Lau Interferometer for Non-destructive Testing." Sci Rep 2017.