Gramse, G., Kölker, A., Lim, T., Stock, T. J. Z., Solanki, H., Schofield, S. R., . . . Curson, N. J. (2017). Nondestructive imaging of atomically thin nanostructures buried in silicon. Sci Adv.
Chicago Style CitationGramse, Georg, et al. "Nondestructive Imaging of Atomically Thin Nanostructures Buried in Silicon." Sci Adv 2017.
Cita MLAGramse, Georg, et al. "Nondestructive Imaging of Atomically Thin Nanostructures Buried in Silicon." Sci Adv 2017.
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