Seely, J. F., Hudson, L. T., Henins, A., & Feldman, U. (2016). High resolution spectrometer for extended x-ray absorption fine structure measurements in the 6 keV to 15 keV energy range. Rev Sci Instrum.
Stile di citazione ChicagoSeely, J. F., L. T. Hudson, Albert Henins, e U. Feldman. "High Resolution Spectrometer for Extended X-ray Absorption Fine Structure Measurements in the 6 KeV to 15 KeV Energy Range." Rev Sci Instrum 2016.
Citazione MLASeely, J. F., L. T. Hudson, Albert Henins, e U. Feldman. "High Resolution Spectrometer for Extended X-ray Absorption Fine Structure Measurements in the 6 KeV to 15 KeV Energy Range." Rev Sci Instrum 2016.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.