Cita APA

Procházka, P., Mareček, D., Lišková, Z., Čechal, J., & Šikola, T. (2017). X-ray induced electrostatic graphene doping via defect charging in gate dielectric. Sci Rep.

Chicago Style Citation

Procházka, Pavel, David Mareček, Zuzana Lišková, Jan Čechal, i Tomáš Šikola. "X-ray Induced Electrostatic Graphene Doping Via Defect Charging in Gate Dielectric." Sci Rep 2017.

Cita MLA

Procházka, Pavel, et al. "X-ray Induced Electrostatic Graphene Doping Via Defect Charging in Gate Dielectric." Sci Rep 2017.