Bello, M. A., Ruiz-León, Y., Sandoval-Sierra, J. V., Rezinciuc, S., & Diéguez-Uribeondo, J. (2017). Scanning Electron Microscopy (SEM) Protocols for Problematic Plant, Oomycete, and Fungal Samples. J Vis Exp.
Citação norma ChicagoBello, M. Angélica, Yolanda Ruiz-León, J. Vladimir Sandoval-Sierra, Svetlana Rezinciuc, and Javier Diéguez-Uribeondo. "Scanning Electron Microscopy (SEM) Protocols for Problematic Plant, Oomycete, and Fungal Samples." J Vis Exp 2017.
MLA CitationBello, M. Angélica, et al. "Scanning Electron Microscopy (SEM) Protocols for Problematic Plant, Oomycete, and Fungal Samples." J Vis Exp 2017.
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