Xu, D., Yu, L., Chen, X., Chen, L., Sun, Q., Zhu, H., . . . Zhang, D. W. (2017). In Situ Analysis of Oxygen Vacancies and Band Alignment in HfO(2)/TiN Structure for CMOS Applications. Nanoscale Res Lett.
Stile di citazione ChicagoXu, Da-Peng, et al. "In Situ Analysis of Oxygen Vacancies and Band Alignment in HfO(2)/TiN Structure for CMOS Applications." Nanoscale Res Lett 2017.
Citazione MLAXu, Da-Peng, et al. "In Situ Analysis of Oxygen Vacancies and Band Alignment in HfO(2)/TiN Structure for CMOS Applications." Nanoscale Res Lett 2017.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.