Palanga, K. K., Jamshed, M., Rashid, M. H. o., Gong, J., Li, J., Iqbal, M. S., . . . Yuan, Y. (2017). Quantitative Trait Locus Mapping for Verticillium wilt Resistance in an Upland Cotton Recombinant Inbred Line Using SNP-Based High Density Genetic Map. Front Plant Sci.
シカゴスタイル引用形Palanga, Koffi Kibalou, et al. "Quantitative Trait Locus Mapping for Verticillium Wilt Resistance in an Upland Cotton Recombinant Inbred Line Using SNP-Based High Density Genetic Map." Front Plant Sci 2017.
MLA引用形式Palanga, Koffi Kibalou, et al. "Quantitative Trait Locus Mapping for Verticillium Wilt Resistance in an Upland Cotton Recombinant Inbred Line Using SNP-Based High Density Genetic Map." Front Plant Sci 2017.
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