McCrackin, F. L., Passaglia, E., Stromberg, R. R., & Steinberg, H. L. (1963). Measurement of the Thickness and Refractive Index of Very Thin Films and the Optical Properties of Surfaces by Ellipsometry. J Res Natl Bur Stand A Phys Chem.
Citação norma ChicagoMcCrackin, Frank L., Elio Passaglia, Robert R. Stromberg, and Harold L. Steinberg. "Measurement of the Thickness and Refractive Index of Very Thin Films and the Optical Properties of Surfaces By Ellipsometry." J Res Natl Bur Stand A Phys Chem 1963.
MLA CitationMcCrackin, Frank L., Elio Passaglia, Robert R. Stromberg, and Harold L. Steinberg. "Measurement of the Thickness and Refractive Index of Very Thin Films and the Optical Properties of Surfaces By Ellipsometry." J Res Natl Bur Stand A Phys Chem 1963.