Giannazzo, F., Fisichella, G., Piazza, A., Di Franco, S., Greco, G., Agnello, S., & Roccaforte, F. (2017). Impact of contact resistance on the electrical properties of MoS(2) transistors at practical operating temperatures. Beilstein J Nanotechnol.
Citação norma ChicagoGiannazzo, Filippo, Gabriele Fisichella, Aurora Piazza, Salvatore Di Franco, Giuseppe Greco, Simonpietro Agnello, and Fabrizio Roccaforte. "Impact of Contact Resistance On the Electrical Properties of MoS(2) Transistors At Practical Operating Temperatures." Beilstein J Nanotechnol 2017.
Citação norma MLAGiannazzo, Filippo, et al. "Impact of Contact Resistance On the Electrical Properties of MoS(2) Transistors At Practical Operating Temperatures." Beilstein J Nanotechnol 2017.