Barrio, L. C., Suchyna, T., Bargiello, T., Xu, L. X., Roginski, R. S., Bennett, M. V., & Nicholson, B. J. (1992). Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage.

Barrio, L C., T. Suchyna, T. Bargiello, L X. Xu, R S. Roginski, M V. Bennett, and B J. Nicholson. Gap Junctions Formed By Connexins 26 and 32 Alone and in Combination Are Differently Affected By Applied Voltage. 1992.

Barrio, L C., et al. Gap Junctions Formed By Connexins 26 and 32 Alone and in Combination Are Differently Affected By Applied Voltage. 1992.