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Lai, Yiu Wai, Michael Krause, Alan Savan, Sigurd Thienhaus, Nektarios Koukourakis, Martin R. Hofmann, und Alfred Ludwig. "High-throughput Characterization of Film Thickness in Thin Film Materials Libraries By Digital Holographic Microscopy." Sci Technol Adv Mater 2011.

Lai, Yiu Wai, et al. "High-throughput Characterization of Film Thickness in Thin Film Materials Libraries By Digital Holographic Microscopy." Sci Technol Adv Mater 2011.