K. C., S., Longo, R. C., Addou, R., Wallace, R. M., & Cho, K. (2016). Electronic properties of MoS(2)/MoO(x) interfaces: Implications in Tunnel Field Effect Transistors and Hole Contacts. Sci Rep.
Chicago-tyylinen lähdeviittausK. C., Santosh, Roberto C. Longo, Rafik Addou, Robert M. Wallace, ja Kyeongjae Cho. "Electronic Properties of MoS(2)/MoO(x) Interfaces: Implications in Tunnel Field Effect Transistors and Hole Contacts." Sci Rep 2016.
MLA-viiteK. C., Santosh, et al. "Electronic Properties of MoS(2)/MoO(x) Interfaces: Implications in Tunnel Field Effect Transistors and Hole Contacts." Sci Rep 2016.
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