Kim, S., & Albert, P. S. (2016). A Class of Joint Models for Multivariate Longitudinal Measurements and a Binary Event. Biometrics.
Παραπομπή Chicago StyleKim, Sungduk, και Paul S. Albert. "A Class of Joint Models for Multivariate Longitudinal Measurements and a Binary Event." Biometrics 2016.
Παραπομπή MLAKim, Sungduk, και Paul S. Albert. "A Class of Joint Models for Multivariate Longitudinal Measurements and a Binary Event." Biometrics 2016.
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