Newbury, D. E. (2002). Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy. J Res Natl Inst Stand Technol.
Chicago-стиль цитированияNewbury, Dale E. "Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy." J Res Natl Inst Stand Technol 2002.
MLA-цитированиеNewbury, Dale E. "Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy." J Res Natl Inst Stand Technol 2002.
Предупреждение: эти цитированмия не могут быть всегда правильны на 100%.