Ngavouka, M. D. N., Capaldo, P., Ambrosetti, E., Scoles, G., Casalis, L., & Parisse, P. (2016). Mismatch detection in DNA monolayers by atomic force microscopy and electrochemical impedance spectroscopy. Beilstein J Nanotechnol.
Citação norma ChicagoNgavouka, Maryse D Nkoua, Pietro Capaldo, Elena Ambrosetti, Giacinto Scoles, Loredana Casalis, and Pietro Parisse. "Mismatch Detection in DNA Monolayers By Atomic Force Microscopy and Electrochemical Impedance Spectroscopy." Beilstein J Nanotechnol 2016.
ציטוט MLANgavouka, Maryse D Nkoua, et al. "Mismatch Detection in DNA Monolayers By Atomic Force Microscopy and Electrochemical Impedance Spectroscopy." Beilstein J Nanotechnol 2016.
אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.