Schein, P., Kang, P., O'Dell, D., & Erickson, D. (2015). Nanophotonic Force Microscopy: Characterizing Particle-Surface Interactions Using Near-Field Photonics. Nano Lett.
Citación estilo ChicagoSchein, Perry, Pilgyu Kang, Dakota O'Dell, and David Erickson. "Nanophotonic Force Microscopy: Characterizing Particle-Surface Interactions Using Near-Field Photonics." Nano Lett 2015.
Cita MLASchein, Perry, Pilgyu Kang, Dakota O'Dell, and David Erickson. "Nanophotonic Force Microscopy: Characterizing Particle-Surface Interactions Using Near-Field Photonics." Nano Lett 2015.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.