Truong, S. N., Shin, S., Byeon, S., Song, J., Mo, H., & Min, K. (2015). Comparative Study on Statistical-Variation Tolerance Between Complementary Crossbar and Twin Crossbar of Binary Nano-scale Memristors for Pattern Recognition. Nanoscale Res Lett.
Stile di citazione ChicagoTruong, Son Ngoc, SangHak Shin, Sang-Don Byeon, JaeSang Song, Hyun-Sun Mo, e Kyeong-Sik Min. "Comparative Study On Statistical-Variation Tolerance Between Complementary Crossbar and Twin Crossbar of Binary Nano-scale Memristors for Pattern Recognition." Nanoscale Res Lett 2015.
Citazione MLATruong, Son Ngoc, et al. "Comparative Study On Statistical-Variation Tolerance Between Complementary Crossbar and Twin Crossbar of Binary Nano-scale Memristors for Pattern Recognition." Nanoscale Res Lett 2015.