Dyksik, M., Motyka, M., Sęk, G., Misiewicz, J., Dallner, M., Weih, R., . . . Höfling, S. (2015). Submonolayer Uniformity of Type II InAs/GaInSb W-shaped Quantum Wells Probed by Full-Wafer Photoluminescence Mapping in the Mid-infrared Spectral Range. Nanoscale Res Lett.

Dyksik, Mateusz, Marcin Motyka, Grzegorz Sęk, Jan Misiewicz, Matthias Dallner, Robert Weih, Martin Kamp, and Sven Höfling. "Submonolayer Uniformity of Type II InAs/GaInSb W-shaped Quantum Wells Probed By Full-Wafer Photoluminescence Mapping in the Mid-infrared Spectral Range." Nanoscale Res Lett 2015.

Dyksik, Mateusz, et al. "Submonolayer Uniformity of Type II InAs/GaInSb W-shaped Quantum Wells Probed By Full-Wafer Photoluminescence Mapping in the Mid-infrared Spectral Range." Nanoscale Res Lett 2015.