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Reducing Multiplexing Artifacts in Multi-Pinhole SPECT with a Stacked Silicon-Germanium System: a Simulation Study
In pinhole SPECT, multi-pinhole collimators can increase sensitivity but may lead to projection overlap, or multiplexing, which can cause image artifacts. In this work we explore whether a stacked-detector configuration with a germanium and a silicon detector, used with (123)I (27–32, 159 keV), wher...
Gorde:
| Argitaratua izan da: | IEEE Trans Med Imaging |
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| Egile Nagusiak: | , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
2014
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4565520/ https://ncbi.nlm.nih.gov/pubmed/25055382 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1109/TMI.2014.2340251 |
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