APA citiranje

Whitley, W., Stock, C., & Huxley, A. D. (2015). A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping. J Appl Crystallogr.

Citação norma Chicago

Whitley, William, Chris Stock, and Andrew D. Huxley. "A Laboratory-based Laue X-ray Diffraction System for Enhanced Imaging Range and Surface Grain Mapping." J Appl Crystallogr 2015.

MLA citiranje

Whitley, William, Chris Stock, and Andrew D. Huxley. "A Laboratory-based Laue X-ray Diffraction System for Enhanced Imaging Range and Surface Grain Mapping." J Appl Crystallogr 2015.