Klarenbeek, J., Goedhart, J., van Batenburg, A., Groenewald, D., & Jalink, K. (2015). Fourth-Generation Epac-Based FRET Sensors for cAMP Feature Exceptional Brightness, Photostability and Dynamic Range: Characterization of Dedicated Sensors for FLIM, for Ratiometry and with High Affinity. PLoS One.
Citação norma ChicagoKlarenbeek, Jeffrey, Joachim Goedhart, Aernoud van Batenburg, Daniella Groenewald, and Kees Jalink. "Fourth-Generation Epac-Based FRET Sensors for CAMP Feature Exceptional Brightness, Photostability and Dynamic Range: Characterization of Dedicated Sensors for FLIM, for Ratiometry and With High Affinity." PLoS One 2015.
Citação norma MLAKlarenbeek, Jeffrey, et al. "Fourth-Generation Epac-Based FRET Sensors for CAMP Feature Exceptional Brightness, Photostability and Dynamic Range: Characterization of Dedicated Sensors for FLIM, for Ratiometry and With High Affinity." PLoS One 2015.