Johnston, S. T., Simpson, M. J., & McElwain, D. L. S. (2014). How much information can be obtained from tracking the position of the leading edge in a scratch assay? The Royal Society.
Citación estilo ChicagoJohnston, Stuart T., Matthew J. Simpson, and D. L. Sean McElwain. How Much Information Can Be Obtained From Tracking the Position of the Leading Edge in a Scratch Assay? The Royal Society, 2014.
Cita MLAJohnston, Stuart T., Matthew J. Simpson, and D. L. Sean McElwain. How Much Information Can Be Obtained From Tracking the Position of the Leading Edge in a Scratch Assay? The Royal Society, 2014.
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