Abraham, J. L., Chandra, S., & Agrawal, A. (2014). Quantification and micron-scale imaging of spatial distribution of trace beryllium in shrapnel fragments and metallurgic samples with correlative fluorescence detection method and secondary ion mass spectrometry (SIMS).
Styl ChicagoAbraham, Jerrold L., Subhash Chandra, a Anoop Agrawal. Quantification and Micron-scale Imaging of Spatial Distribution of Trace Beryllium in Shrapnel Fragments and Metallurgic Samples With Correlative Fluorescence Detection Method and Secondary Ion Mass Spectrometry (SIMS). 2014.
Citace podle MLAAbraham, Jerrold L., Subhash Chandra, a Anoop Agrawal. Quantification and Micron-scale Imaging of Spatial Distribution of Trace Beryllium in Shrapnel Fragments and Metallurgic Samples With Correlative Fluorescence Detection Method and Secondary Ion Mass Spectrometry (SIMS). 2014.