Cita APA

Yuan, F., Zhang, Z., Wang, J., Pan, L., Xu, J., & Lai, C. (2014). Total ionizing dose (TID) effects of γ ray radiation on switching behaviors of Ag/AlO( x )/Pt RRAM device. Springer.

Chicago Style Citation

Yuan, Fang, Zhigang Zhang, Jer-Chyi Wang, Liyang Pan, Jun Xu, i Chao-Sung Lai. Total Ionizing Dose (TID) Effects of γ Ray Radiation On Switching Behaviors of Ag/AlO( x )/Pt RRAM Device. Springer, 2014.

Cita MLA

Yuan, Fang, et al. Total Ionizing Dose (TID) Effects of γ Ray Radiation On Switching Behaviors of Ag/AlO( x )/Pt RRAM Device. Springer, 2014.