Kissick, D. J., Muir, R. D., Sullivan, S. Z., Oglesbee, R. A., & Simpson, G. J. (2013). Real-time dynamic range and signal to noise enhancement in beam-scanning microscopy by integration of sensor characteristics, data acquisition hardware, and statistical methods.

Kissick, David J., Ryan D. Muir, Shane Z. Sullivan, Robert A. Oglesbee, and Garth J. Simpson. Real-time Dynamic Range and Signal to Noise Enhancement in Beam-scanning Microscopy By Integration of Sensor Characteristics, Data Acquisition Hardware, and Statistical Methods. 2013.

Kissick, David J., et al. Real-time Dynamic Range and Signal to Noise Enhancement in Beam-scanning Microscopy By Integration of Sensor Characteristics, Data Acquisition Hardware, and Statistical Methods. 2013.