Dey, S., Lewellen, T. K., Miyaoka, R. S., & Rudell, J. C. (2012). Impact of Analog IC Impairments in SiPM Interface Electronics.
Dyfyniad Arddull ChicagoDey, Samrat, Thomas K. Lewellen, Robert S. Miyaoka, and Jacques C. Rudell. Impact of Analog IC Impairments in SiPM Interface Electronics. 2012.
Dyfyniad MLADey, Samrat, Thomas K. Lewellen, Robert S. Miyaoka, and Jacques C. Rudell. Impact of Analog IC Impairments in SiPM Interface Electronics. 2012.
Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.